Reliability evaluation of alumina-blasted/acid-etched versus laser-sintered dental implants
Sat, 2012-07-28 07:48 — Guest
Abstract
Step-stress accelerated life testing (SSALT) and fractographic analysis were performed to evaluate the reliability and failure
modes of dental implant fabricated by machining (surface treated with alumina blasting/acid etching) or laser sintering for
anterior single-unit replacements. Forty-two dental implants (3.75 × 10 mm) were divided in two groups (n = 21 each): laser sintered (LS) and alumina blasting/acid etching (AB/AE). The abutments were screwed to the implants and
standardized maxillary central incisor metallic crowns were cemented and subjected to SSALT in water. Use-level probability
Weibull curves and reliability for a mission of 50,000 cycles at 200 N were calculated. Polarized light and scanning electron
microscopes were used for failure analyses. The Beta (β) value derived from use-level probability Weibull calculation of 1.48
for group AB/AE indicated that damage accumulation likely was an accelerating factor, whereas the β of 0.78 for group LS indicated
that load alone likely dictated the failure mechanism for this group, and that fatigue damage did not appear to accumulate.
The reliability was not significantly different (p > 0.9) between AB/AE (61 %) and LS (62 %). Fracture of the abutment and fixation screw was the chief failure mode. No implant
fractures were observed. No differences in reliability and fracture mode were observed between LS and AB/AE implants used
for anterior single-unit crowns.
modes of dental implant fabricated by machining (surface treated with alumina blasting/acid etching) or laser sintering for
anterior single-unit replacements. Forty-two dental implants (3.75 × 10 mm) were divided in two groups (n = 21 each): laser sintered (LS) and alumina blasting/acid etching (AB/AE). The abutments were screwed to the implants and
standardized maxillary central incisor metallic crowns were cemented and subjected to SSALT in water. Use-level probability
Weibull curves and reliability for a mission of 50,000 cycles at 200 N were calculated. Polarized light and scanning electron
microscopes were used for failure analyses. The Beta (β) value derived from use-level probability Weibull calculation of 1.48
for group AB/AE indicated that damage accumulation likely was an accelerating factor, whereas the β of 0.78 for group LS indicated
that load alone likely dictated the failure mechanism for this group, and that fatigue damage did not appear to accumulate.
The reliability was not significantly different (p > 0.9) between AB/AE (61 %) and LS (62 %). Fracture of the abutment and fixation screw was the chief failure mode. No implant
fractures were observed. No differences in reliability and fracture mode were observed between LS and AB/AE implants used
for anterior single-unit crowns.
- Content Type Journal Article
- Category Original Article
- Pages 1-8
- DOI 10.1007/s10103-012-1170-8
- Authors
- Erika O. Almeida, Department of Biomaterials and Biomimetics, New York University, 345E, 24th Street, New York, NY 10010, USA
- Amilcar C. Freitas Júnior, Department of Biomaterials and Biomimetics, New York University, 345E, 24th Street, New York, NY 10010, USA
- Estevam A. Bonfante, Postgraduate Program in Dentistry, UNIGRANRIO University—School of Health Sciences, Rua Prof. José de Souza Herdy, 1.160, 25 de Agosto, Duque de Caxias, RJ, Brazil 25071-202
- Nelson R. F. A. Silva, Department of Operative Dentistry, Federal University of Minas Gerais-UFMG, Belo Horizonte, MG 31270-901, Brazil
- Paulo G. Coelho, Department of Biomaterials and Biomimetics, New York University, 345E, 24th Street, New York, NY 10010, USA
- Journal Lasers in Medical Science
- Online ISSN 1435-604X
- Print ISSN 0268-8921
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